EMX-2632/2616 - 32/16-channel multifunction digitizer

EMX-2632/2616 - 32/16-channel multifunction digitizer
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Main features
  • 32/16 input differential channels
  • Ohms/RTD & voltage measurements
  • 16-bit SAR ADC scanning or simultaneous sampling
  • 8/4 channels simultaneous 1.6MSPS (16-bit)
  • 32/16 channels 400KSPS (16-bit) maximum using 4-to-1 multiplexer
  • Volts input ranges: 16V, 2V, 0.25V
  • 4-wire ohms ranges: 400Ω, 4kΩ, 40kΩ
  • Selectable 8kHz 1-pole lowpass filter
  • 2/1 output channels: ±10V or ±20mA
  • 16/8 DIO: 3.3V
  • Built-in-self-test (BIST) & calibration
  • IEEE 1588 synchronization
  • PXIe 3U
EMX-2616 EMX-2616-1 16-channel, 16-bit 1.6MSPS, 1-channel DAC, 8 DIO
EMX-2632 EMX-2632-1 32-channel, 16-bit 1.6MSPS, 2-channel DAC, 16 DIO

EMX-2632/2616 : 32/16 Channel Multifunction Digitizer

The EMX-2632/2616 delivers the highest performance measurements possible while controlling overall test hardware costs. With 32/16 differential channels of voltage or resistance, independent 16-bit ADCs per 4-channels, extensive software-selectable filtering, and independent signal conditioning paths, this instrument delivers exceptional accuracy and reliability.

Built-in signal conditioning and programmable excitation integrated into the instrument and configurable on a per-channel basis greatly simplifies setup and provides unmatched flexibility. With unmatched performance, accuracy, and reliability, the EMX-2632/2616 is the “go-to” solution for a wide variety of test applications worldwide.

The EMX-2632/2616 together with the EMX-2500 Controller support easy integration and synchronization of multiple devices through the IEEE-1588 v2 Precision Time Protocol standard for synchronization, providing an architecture that can be scaled from tens to thousands of channels. Multiple instruments can be easily distributed extremely close to the measurement points of interest, reducing the run length of analog cabling and minimizing errors induced by noisy environments.

Confidence
Manufacturing and test environments of today are dynamic, dictating minimal downtime of test systems to meet increasing product throughput demands. Ensuring that acquired data is reliable and that instrument calibration can be turned around quickly are keys to the success of any production team. VTI embeds intelligence into the EMX-2632/2616 to facilitate maximum system “uptime” and increase manufacturing efficiency. BIST, Self-CAL, can be executed prior to a critical test to provide confidence that the digitizer and connections to the transducers are OK.

Connectivity
The EMX-2632/2616 is designed for operation in any standard PXI(e) environment. These cards are engineered to work with any standard PXI chassis with a wide range of software tools and drivers available to make integration seamless.

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