52401-25-200m | Dual Independent & Isolated SMU, 25V/200mA | |
52405-5-3 | High Precision Source Measure Unit, 5V/3.5A | |
52405-10-2 | High Precision Source Measure Unit, 10V/2.5A | |
52405-25-1 | Dual Independent & Isolated SMU, 25V/1A | |
52405-25-3 | High Precision Source Measure Unit, 25V/3.5A |
52400 - High Precision Source Measure Unit (SMU)
- Hybrid Compatible PXI
- Four quadrant operation
- High source/measurement resolution (multiple ranges)
- Low output noise
- High programming/measurement speed (100k s/S) & slew rate
- Optional measurement log
- DIO bits
- Output profiling by hardware sequencer
- Programmable output resistance
- Floating & Guarding output
- 16 Control Bandwidth Selection
- Master / Slave operation
- Driver with LabView/LabWindows & C/C# API
- Softpanel GUI
The Chroma 52400 series is PXI based SMU (Source Measurement Unit) card designed for highly accurate source or load simulation with high precision voltage and current measurements.
SMU combines four-quadrant-source with high precision and high speed measurement. This unique capability makes a SMU the ideal instrument in many parametric test applications ranging from ICs, two-leaded components such as sensors, LEDs, Laser Diodes, Transistors, Solar cells, Batteries and many other electronics devices.
To meet various test requirements, the 52400 series has 16 control bandwidths allowing user selection of a stable operation, multi-ranges combined with 18 bit DAC/ADC provide the best programming and measurement resolution and accuracy available at a sampling rate of up to 100k s/S. Special programmable output resistance allows user to set as internal series resistance of a battery thus makes Chroma 52400 series SMU an ideal tool acting as a battery simulator.
±force, ±sense and ±guards lines are standard to avoid leakage current and reduce settling time especially for the mobile IC and Sensor test applications requiring very low current.
The 52400 series has a built-in patented hardware sequence engine that uses deterministic timing to control each SMU. This sequencer comes with built-in 32k readings storage memory, it allows for cross module/card synchronization and latency free output control and measurement. This measurement is possible as no PC communication needed during test process.
C/C# and Various versions of LabView/ LabWindows APIs plus versatile soft front panel are offered as standard accessories. The back connectors are compatible with both PXI and PXIe chassis. All of these features enable easiest integration to PXI or PXIe systems designed for any application.
- Semiconductor Test
- LED / Laser Diode Test
- Battery Test
- Transistor Test
- Solar Cell Test
- Electric Vehicle Test
- Avionics Test
- Power Electronics Test
- Sensor Test