Addressing the testing needs for all types of semiconductor components
The world is pushed to change by the advance in semiconductor technologies. This is the time when artificial intelligence meets 5G, when autonomous cars meets big data analysis, with everything consolidated into a portable device. Semiconductor test systems need to be transformed to a new era where all sorts of features needs to be integrated into a tiny system. The emerging PXIe based platform provides a good viable path to fulfill the needs in the new era. Chroma’s PXIe Semiconductor Test Solutions give our clients a versatile workplace to complete the semiconductor test while integrating functional instrument modules from different suppliers.
Semiconductor Test Class Power Source for Automotive and Other Applications
Chroma 33021 PXIe based programmable power supply card is an integrated power supply module for higher voltage up to 48 voltage at 250mA current. The outputs can be ganged together with output current up to 500mA per card, and parallel the output across cards for high current needs. With an 18-bit force voltages resolution and 18-bit measurement voltage resolution at 1Msps sampling rate, users will be able to read the supply output voltage and current data and save them into the built-in source and capture memory. Programmable voltage and current protection clamps are also designed to make sure the power source is well controlled without risks.
Proprietary Software, CRAFT and other rich features of software support
In addition to supporting the LabView and LabWindows environment, Chroma provides a proprietary software suite, CRAFT. CRAFT, running on Microsoft Windows operation system, contains the full set of tools for semiconductor test from test program development, debugging, production and maintenance. The production tools include easy-of-use GUI software such as Operator Interface, Test data output, Binning and Sequence Control, Wafer Map, Summary Tool, and rich sets prober/handler drivers. The user debugging tools includes the Datalog, Plan Debug, TCM, Shmoo, Pattern Editor, Waveform, etc. It also supports LabView and LabWindow environment and a subset of debugging tools are provided. In addition, a third party CAD to ATE pattern conversion tool is also supported to cover the WGL/STIL/VCD/EVCD conversions.
